Single crystal X-ray diffraction analysis. Refinement of the crystal structure.

Determination of linear and angular unit cell parameters, symmetry and space group of crystals, atomic coordinates and its thermal displacement parameters, interatomic distances and angular characteristics for the chemical bonding, calculation of the theoretical powder patterns according to the single-crystal X-ray diffraction data. Refinement of the site occupancy factors (e.g. in the case of solid solutions). Description of the coordination polyhedra geometric characteristics and ways of their arrangement in the structure. Read more →

Powder X-ray diffraction analysis. Crystalline phase qualitative and / or quantitative analysis.

Identification of different crystalline phases and the determination of their relative concentrations in mixtures according to the powder X-ray diffraction. Precise determination of the known substance unit cell parameters to detect and determine the concentrations of isomorphic impurities. Diffraction patterns indexing, determination of the unit cell parameters and a possible space group for the new compounds. Full analysis of the powder X-ray diffraction pattern, which includes refinement of the crystal structure and determination of some characteristics of the defect substructure for the new material. Read more →

Thermal X-ray analysis. Crystalline phase qualitative and / or quantitative analysis in the temperature range of -180 – 1600 ° C.

Provides information on the phase transition temperature, the most reliable way to interpret a variety of transformations, "solid-to-solid" (polymorphic transitions, decay and formation of chemical compounds and solid solutions, amorphization), "solid-to-liquid" (congruent, eutectic and peritectic melting, melting of the solid solutions, and crystallization from the melt), "solid-to-gas" (hydration, dehydration, loss of other volatile components except H2O and OH). Read more →

High-resolution X-ray diffraction and defectoscopy with D8 DISCOVER diffractometer

The study of ultrafine (nano-) materials, bulk single crystals, thin films and alloys by analyzing reflections profile by the means of wide angle scattering, small-angle scattering and diffraction at grazing angles. Studying of surface and interface structures between the substrates and thin films, determination of layer thickness and tracking of structural changes into the sample. NDT quality (excellence) control of massive industrial crystals for electronics and optics; determination of stress and textural studis of ceramic and metal samples. Investigation of "microstructures": characterization of crystalline materials micro structure and microstrain, characterization of the defect substructure in bulk samples and in catalysts nanoscale crystals. Read more →

Spectroscopy. IR spectroscopy, DSC, TGA

Auxiliary methods to obtain additional information for proper interpretation of the single-crystal and powder X-ray diffraction data include UV-, IR- and visible light spectroscopy, differential scanning calorimetry and thermogravimetric analysis. Read more →